For an F-test to be inferentially valid, all of the following assumptions must be true EXCEPT the
A. populations must be discrete distributions
B. populations must be normally distributed
C. samples must be independent
D. samples must be randomly selected from the population
The most important aspect of functional requirements is that they
A. describe a single, measurable performance
B. describe how a product or service should operate
C. be traceable to the voice of the customer
D. provide upper and lower performance limits
In the late 1980's ______________ coined the name Six Sigma for a methodology that had its origins at Motorola for quality related work being done there.
A. Joseph Juran
B. William Smith
C. Mikel Harry
D. Bill Lary
When = 10, what sample size is needed to specify a 95% confidence interval of units from the mean?
A. 7
B. 11
C. 32
D. 43
Which of the following tools can be used to identify and quantify the source of a problem?
A. Affinity diagram
B. Control chart
C. Pareto chart
D. Quality function deployment
According to Juran, when a major quality improvement project is launched, which of the following describes the desired change in performance level?
A. Six sigma
B. Continuous
C. Breakthrough
D. Sporadic
Statistical process control (SPC) is best defined as the use of
A. Pareto charts to understand and control a process
B. inputs to control critical and complex processes
C. statistical methods to identify and remove manufacturing errors
D. statistical methods to understand and control a process
Which of the following most influences consumer perception of quality?
A. Industry standards
B. Company financial performance
C. Audit results
D. Service and repair policies
The primary factor in the successful implementation of six sigma is to have
A. the necessary resources
B. the support/leadership of top management
C. explicit customer requirements
D. a comprehensive training program
Which of the following measures is increased when process performance is improved?
A. Variability range
B. Capability index
C. Repeatability index
D. Specification limits
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